Williams 05 - 2000-2011 - EDN.pdf
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design
feature
By Jim Williams and Todd Owen, Linear Technology Corp
ALTHOUGH VERIFYING THAT A LOW-DROPOUT REGULATOR
MEETS ITS DROPOUT SPECIFICATION IS STRAIGHTFORWARD,
VERIFYING ITS NOISE PERFORMANCE PROVES MORE DIFFI-
CULT. YOU HAVE TO PAY CAREFUL ATTENTION TO THE TEST
SETUP, INCLUDING THE VOLTMETER YOU USE.
Exacting noise test ensures
low-noise performance of
low-dropout regulators
T
ELECOMMUNICATIONS, NETWORKING, audio, and
dropout needs. For some help in selecting the right
device, see
sidebar
“Selecting a low-noise, low-
dropout regulator.” For some more background on
low-dropout-regulator architecture, see
sidebar
“The architecture of a low-noise low-dropout reg-
ulator.”
Testing such low-noise devices takes great care.
Fortunately, establishing and specifying low-
dropout performance is easy. Verifying that a regu-
lator meets dropout specification is similarly
straightforward. However, accomplishing the same
missions for noise and noise testing involves more
effort. The manufacturer or whoever is performing
the testing must clearly call out the noise bandwidth
of interest along with the operating conditions. Op-
erating conditions can include regulator input and
instrumentation applications increasingly re-
quire low-noise power supplies. Low-noise, low-
dropout linear regulators interest designers who
work in these application areas. These components
may exclusively power noise-sensitive circuitry, cir-
cuitry that contains only some noise-sensitive ele-
ments, or both. Additionally, to conserve power, par-
ticularly in battery-driven apparatus, such as cellular
telephones, the regulators must operate with low in-
put-to-output voltages. New devices meet the con-
current requirements for low noise, low dropout,
and small quiescent current. For example, the
LT1761 has noise of 20
V
RMS
, a dropout of 300 mV
at 100 mA, and a quiescent current of 20
m
A. Clear-
ly, all designs have different low-noise and low-
m
Figure 1
10-Hz, SECOND-
ORDER
BUTTERWORTH
HIGHPASS
100-kHz, FOURTH-
ORDER
BUTTERWORTH
LOWPASS
5-Hz FIRST-ORDER
HIGHPASS
5-Hz, SINGLE-ORDER
HIGHPASS
10 Hz TO
100 kHz
IN
GAIN=60 dB
In this filter structure for noise testing of low-dropout regulators, Butterworth-filter sections provide the steep slopes and flat
passband in the desired frequency range of 10 Hz to 100 kHz.
MAY 11, 2000
|
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design
feature
Low-noise, low-dropout regulators
EXTERNAL INPUT
4.5V
+
IC
2
LT1028
4.7
m
F
4.7
m
F
+
IC
1
LT1028
+
IC
3
LT1224
100
Figure 2
_
NORMAL
INPUT
330
m
F
4.99k
100
_
FILTER
INPUT
_
2k
6.19k
3.16k
2.49k
14.5V
5.9k
V
IN
5V OUTPUT
IN
OUT
LT1761-5
R
LOAD
(TYPICALLY
100 mA)
0.01 mF
C
BYP
+
D BATTERY
STACK
10 mF
1 mF
SHDN
BYP
GND
TYPICAL REGULATOR UNDER TEST
10k
OUTPUT TO THERMALLY
RESPONDING RMS VOLTMETER.
0.1V FULL SCALE=100 mV RMS OF NOISE
IN A 10-Hz TO 100-kHz BANDWIDTH.
10k
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
13k
5.62k
10k
10k
330 mF
100
+
14.5V
14.5V
NOTES:
ALL RESISTORS=1% METAL FILM.
4.7-mF CAPACITORS=MYLAR,
WIMA MKS-2.
330-mF CAPACITORS=SANYO OSCON.
±4.5V DERIVED FROM SIX AA CELLS.
POWER REGULATOR FROM
APPROPRIATE NUMBER OF D-SIZE
BATTERIES
LT1562
IC
4
4.5V
110k
110k
17.8k
43.2k
110k
110k
Low-noise amplifiers IC
1
and IC
2
provide gain and initial highpass shaping. IC
4
’s filter IC implements a fourth-order-Butterworth lowpass characteristic.
output voltage, load, and the character-
istics of assorted discrete components.
Numerous subtleties can affect low-noise
performance, and changes in operating
conditions can cause unwelcome sur-
prises. Thus, manufacturers must quote
low-dropout- regulator noise perform-
ance under specified operating and
bandwidth conditions for the specifica-
tion to be meaningful. Misleading data
and erroneous conclusions result when
you fail to observe this precaution.
of concern. Additionally, linear regula-
tors produce little noise energy outside
this region. Switching regulators are a dif-
ferent proposition and require a broad-
band noise measurement (
Reference 1
).
These considerations suggest a measure-
ment bandpass of 10 Hz to 100 kHz with
steep slopes at the bandlimits.
Figure 1
DETERMINE THE NOISE BANDWIDTH FOR TEST
Before testing, you have to determine
the noise bandwidth of interest. For most
systems, the range of 10 Hz to 100 kHz
is the information-signal-processing area
continued on pg 152
SELECTING A LOW-NOISE, LOW-DROPOUT REGULATOR
Any design has requirements for a
low-noise, low-dropout regulator,
and you should carefully examine
each situation for specific needs.
However, some general guide-
lines apply in selecting a low-
noise, low-dropout regulator. Con-
sider the following significant
issues:
Current capacity
: Ensure that
the regulator has adequate out-
put-current capacity for the appli-
cation, including worst-case tran-
sient loads.
Power dissipation
: The device
must be able to dissipate whatev-
er power is necessary, which af-
fects package choice. Usually, the
V
IN
2
the low-dropout regulator meets
the system’s noise requirement
over the entire bandwidth of in-
terest; 10 Hz to 100 kHz is realis-
tic, because information usually
occupies this range.
Input-noise rejection
: Ensure
that the regulator can reject input-
related disturbances originating
from clocks, switching regulators,
and other power-bus users. If the
regulator’s power-supply rejection
is poor, its low-noise characteris-
tics are useless.
Load profile
: Know the load
characteristics. Steady-state drain
is important, but you must also
evaluate transient loads. The reg-
ulator must maintain stability and
low-noise characteristics under all
such transient loads.
Discrete components
: The
choice of discrete components,
particularly capacitors, is impor-
tant. The wrong capacitor dielec-
tric can adversely affect stability,
noise performance, or both.
V
OUT
differential is low in low-
dropout-regulator applications, ob-
viating this issue. Prudence dictates
checking to be sure.
Package size
: Package size is
important in limited-space appli-
cations. Current capacity and
power-dissipation constraints dic-
tate the package size.
Noise bandwidth
: Ensure that
150
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MAY 11, 2000
www.ednmag.com
ARCHITECTURE OF A LOW-NOISE, LOW-DROPOUT REGULATOR
Figure A
shows a design scheme
for a low-noise, low-dropout reg-
ulator that the LT176X through
LT196X family of regulators uses.
This scheme minimizes noise
transmission within the loop and
minimizes noise from an unregu-
lated input. The bypass capacitor,
C
BYP
, filters the internal voltage ref-
erence’s noise. Additionally, the
scheme shapes the error amplifi-
er’s frequency response to mini-
mize noise contribution while pre-
serving transient response and
power-supply rejection ratio. Reg-
ulators that do not shape this re-
sponse have poor noise rejection
and transient performance.
Achieving an extremely low
dropout voltage requires careful
design of the pass element. The
pass element’s on-impedance lim-
its set dropout limitations. The
ideal pass element has zero im-
pedance between the input and
the output and consumes no drive
energy.
A number of design and tech-
nology options offer various trade-
offs and advantages.
Figure B
shows some pass-element candi-
dates. Followers (
Figure Ba
) offer
current gain, ease of loop com-
pensation because the voltage
gain is below unity, and drive cur-
rent that ends up going to the
load. Unfortunately, saturating a
voltage follower requires over-
driving the input, at the base or
gate, for example. Generating the
overdrive is difficult because the
regulator usually derives the drive
directly from V
IN
. Practical circuits
must either generate the overdrive
or obtain it elsewhere. Without
voltage overdrive, the V
BE
sets the
saturation loss in the bipolar case,
and channel on-resistance sets the
saturation loss for MOS. MOS-
channel on-resistance varies un-
der these conditions; you can
more easily predict bipolar losses.
Voltage losses in driver stages,
such as Darlington stages, add di-
rectly to the dropout voltage. The
follower output of conventional
three-terminal IC regulators com-
bines with drive-stage losses to set
dropout at 3V.
The common emitter/source is
another pass-element option (
Fig-
ure Bb
). This configuration re-
moves the V
BE
loss in the bipolar
case. The pnp version is easy to
fully saturate, even in IC form. The
trade-off is that the base current
never arrives at the load, which
wastes power. At higher currents,
base drive losses can negate a
common emitter’s saturation ad-
vantage. As in the follower exam-
ple, Darlington connections exac-
erbate the problem. Achieving low
Figure A
PASS
ELEMENT
INPUT
OUTPUT
REGULATING
LOOP
C
BYP
ERROR
AMPLIFIER
V
REF
A low-dropout-regulator design scheme minimizes noise within the
loop and minimizes noise from an unregulated input.
Figure B
COMMON
EMITTER/SOURCE
FOLLOWERS
COMPOUND
V
IN
V
OUT
V
IN
V
OUT
V
IN
V
OUT
V
IN
V
OUT
V
IN
V
OUT
V
IN
V
OUT
V
IN
V
OUT
1
V
(a)
(b)
(c)
Pass-element candidates include followers (a), common-emitter/source types (b), and compound types (c).
dropout in a monolithic pnp reg-
ulator requires a pnp structure that
attains low dropout while mini-
mizing base drive loss. This re-
quirement becomes the case at
higher pass currents. Designers of
the LT176X through LT196X regu-
lators expended considerable ef-
fort in this area.
Common-source-connected p-
channel MOSFETs are also candi-
dates (
Figure Bb
). They do not suf-
fer the drive losses of bipolar
devices but typically require volts
of gate-channel bias to fully satu-
rate. In low-voltage applications,
this bias may require generating
negative potentials. Additionally,
p-channel devices have poorer
saturation than equivalent-size n-
channel devices.
The voltage gain of common-
emitter and -source configurations
is a loop-stability concern but is
manageable.
Compound connections using
a pnp-driven npn (
Figure Bc
) are
a reasonable compromise, partic-
ularly for high power—beyond 250
mA—IC construction. The trade-off
between the pnp V
CE
saturation
term and reduced drive losses
over a conventional pnp structure
is favorable. Also, the major cur-
rent flow is through a power npn,
which is easy to realize in mono-
lithic form. The connection has
voltage gain, necessitating atten-
tion to loop-frequency compen-
sation. Regulators that use this
pass scheme, such as the LT1083
through LT1086, can supply as
much as 7.5A with dropouts below
1.5V.
MAY 11, 2000
|
EDN
151
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design
feature
Low-noise, low-dropout regulators
shows a conceptual filter for low-
dropout-regulator-noise testing.
Steep slopes and flatness in the
passband require the Butterworth-filter
sections. The small input level requires
60 dB of low-noise gain to provide an
adequate signal for the Butterworth
filters.
Figure 2
details the filter scheme for
the LT1761-5 regulator under test. IC
1
to
IC
3
make up a 60-dB-gain highpass sec-
tion. IC
1
and IC
2
, which are extre
me
ly
low-noise amplifiers (
Figure 3
FILTER-OUTPUT
AMPLITUDE
(10 dB/DIV)
Hz),
comprise a 60-dB gain stage with a 5-Hz
highpass input. IC
3
provides a 10-Hz,
second-order-Butterworth, highpass
characteristic. The design configures
IC
4
’s filter IC as a fourth-order-Butter-
worth, lowpass filter. The circuit delivers
the output of this filter to the output via
the 330-
,
1 nV/
=
(a)
3 Hz
10 kHz
FREQUENCY
highpass network.
The circuit’s output drives a thermally
responding rms voltmeter. Obtaining
meaningful measurements depends
greatly on your choice of an rms volt-
meter (see “Understanding and selecting
rms voltmeters” on page 54.) Batteries
furnish all power to the circuit, which
precludes ground loops from corrupting
the measurement.
m
F/100
V
NOISE
RESIDUE
(2
m
V/DIV)
VERIFY INSTRUMENTATION PERFORMANCE
Good measurement technique dic-
tates verifying the noise test instrumen-
tation’s performance.
Figure 3a
’s spec-
tral plot of the filter section shows an
essentially flat response in the 10-Hz to
100-kHz passband with abrupt slopes at
the band extremes. Some flatness devia-
tion exists, but the response stays well
within 1 dB throughout nearly the entire
passband. Grounding the filter’s input
determines the tester’s noise floor.
Fig-
ure 3b
shows noise of less than 4
(b)
1 mSEC/DIV
A spectrum analyzer plot (HP-4195A) of the test circuit’s filter characteristics (a) verify a nearly flat
response over the desired 10-Hz to 100-kHz frequency range with a steep roll-off outside the band-
pass region. The test setup’s noise residue of less than 4 mV p-p corresponds to approximately a 0.5
m
V-rms measurement-noise floor (b).
Figure 4
m
V p-
p , corresponding to a 0.5-
V-rms volt-
meter reading. This noise level is only
about 0.5% of full scale, contributing
negligible error. These results give you
the confidence to proceed with regula-
tor-noise measurement.
Regulator-noise measurement begins
with attention to test-setup details. The
extremely low signal levels require atten-
tion to shielding, cable management, lay-
out, and component choice.
Figure 4
shows the bench arrangement; to obtain
faithful noise measurements you need a
completely shielded environment. The
m
A shielded can contains the regulator, and the noise filter circuitry occupies the small black box.
The oscilloscope and rms voltmeter never connect to the test set simultaneously, precluding a
ground loop from corrupting the measurement.
152
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